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Joint Test Action Group
Results: 911

#	Item
681	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for September 6th, [removed]AM – 10:15 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-10-01 11:53:51 Computing Technology Joint Test Action Group Standards organizations Institute of Electrical and Electronics Engineers Cron Boundary scan description language Boundary scan Electronics manufacturing Electronics IEEE standards
682	Flash Memory ‘Bumping’ Attacks Sergei Skorobogatov University of Cambridge, Computer Laboratory, 15 JJ Thomson Avenue, Cambridge CB3 0FD, United Kingdom [removed] Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2010-05-26 22:55:14 Electronic engineering Digital electronics Embedded systems Computer storage Flash memory Non-volatile memory Microcontroller Joint Test Action Group Field-programmable gate array Computer memory Electronics Computer hardware
683	Section 13 – Scope of proposed project. The project develops Analog Boundary Scan Description Language (ABSDL), to describe the boundary scan implementation in a mixed-signal device conforming to IEEE[removed]A Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:21:38 Boundary scan description language Boundary scan Business Joint Test Action Group Institute of Electrical and Electronics Engineers Electronics manufacturing Technology Engineering
684	Silicon scanning reveals hidden backdoors in semiconductor chips Computer Laboratory Security Group Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2013-07-01 08:42:32 Embedded systems IEEE standards Manufacturing Joint Test Action Group Field-programmable gate array Backdoor Field-programmability Atmel AVR Electronics Electronic engineering Electronics manufacturing
685	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for July 23rd, 2007 7:30 AM – 8:50 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-08-20 15:23:01 Boundary scan Electronics manufacturing Technology Joint Test Action Group
686	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for June 26th, 2007 7:30 AM – 8:55 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-07-18 15:26:47 Electronics Joint Test Action Group Attribute Minutes Meeting Technology Business Electronics manufacturing IEEE standards Embedded systems
687	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for August 30th, [removed]AM – 12 PM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-10-01 11:53:56 Boundary scan description language Boundary scan Joint Test Action Group Business Institute of Electrical and Electronics Engineers Electronics manufacturing Technology Engineering
688	Analog Boundary Scan Description Language (ABSDL) Bambang Suparjo Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 17:20:20 Electronic engineering Boundary scan description language Joint Test Action Group Boundary scan Ethernet over twisted pair Electronics manufacturing Manufacturing Electronics
689	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for February 22nd, 2005 8:00AM-10:15AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:22:15 Electronics manufacturing Electronic engineering Joint Test Action Group Cron MOS Technology SID Electronics Computing Embedded systems
690	Microsoft PowerPoint - dot4_itc2010_final.pptx Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2010-10-29 13:05:00 Joint Test Action Group Electronics manufacturing Technology Boundary scan

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